Alves, Marcos José PereiraGonzalez-Chavez, Diego ErnestoBohn, FelipeSommer, Rubem Luis2021-11-262021-11-262015-03-26ALVES, Marcos José Pereira; GONZALEZ-CHAVEZ, Diego Ernesto; BOHN, Felipe; SOMMER, Rubem Luis. Annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films. Journal Of Applied Physics, [S.l.], v. 117, n. 12, p. 123913/1-123913/6, 28 mar. 2015. AIP Publishing. Disponível em: https://aip.scitation.org/doi/10.1063/1.4913249. Acesso em: 31 mai. 2020. DOI: http://dx.doi.org/10.1063/1.4915330.0021-89791089-7550https://repositorio.ufrn.br/handle/123456789/45036We systematically investigate the annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films with thickness of 100 nm. We correlate the non-uniform residual stress obtained from grazing incidence x-ray diffraction measurements with the ferromagnetic resonance (FMR) linewidth due to effective field inhomogeneities measured from broadband ferromagnetic resonance absorption measurements. We also estimate the annealing temperature effect on the Gilbert and two-magnon scattering contributions to the total ferromagnetic resonance FMR linewidth. We show that the effective field inhomogeneities constitute the main contribution to the microwave linewidth, while this contribution is related to the non-uniform residual stress in the films which is reduced by thermal annealingAnnealingThin filmsFerromagnetic resonanceMagnonsarticle