Feitor, Michelle CerqueiraS. Sobrinho, V. S.Miranda Neto, José Queiroz deLima, L. L. F.Souza, Iedo ALibório, Maxwell SantanaQueiroz, José César Augusto deSousa, Rômulo Ribeiro Magalhães deAlmeida, Érika Oliveira deCosta, Thércio Henrique de Carvalho2022-01-052020-09-23S. SOBRINHO, V. S.; M. NETO, J.Q.; LIMA, L.L.F.; SOUZA, I.A.; LIBÓRIO, M.S.; QUEIROZ, J.C.A.; SOUSA, R.R.M.; ALMEIDA, E.O.; FEITOR, M.C.; COSTA, T.H.C.. Optical-Electrical Properties and Thickness Analysis of TiO2 Thin Films Obtained by Magnetron Sputtering. Brazilian Journal of Physics, [S.l.], v. 50, n. 6, p. 771-779, 23 set. 2020. Disponível em: https://link.springer.com/article/10.1007%2Fs13538-020-00794-3. Acesso em: 14 abr. 2021. http://dx.doi.org/10.1007/s13538-020-00794-3.0103-97331678-4448https://repositorio.ufrn.br/handle/123456789/45566Attribution 3.0 Brazilhttp://creativecommons.org/licenses/by/3.0/br/Thin filmsMagnetron sputteringSwanepoel methodPUMATransmittancearticle10.1007/s13538-020-00794-3