Spectral domain analysis of double screen frequency selective surfaces

dc.contributor.authorCampos, Antonio Luiz Pereira de Siqueira
dc.contributor.authorSilva, Tércio de Lima
dc.date.accessioned2022-01-04T13:59:05Z
dc.date.available2022-01-04T13:59:05Z
dc.date.issued2012-06
dc.description.resumoThis paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental resultspt_BR
dc.identifier.citationCAMPOS, Antonio Luiz Pereira de Siqueira; SILVA, Tércio de Lima; Spectral Domain Analysis of Double Screen Frequency Selective Surfaces. Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 11, No. 1, June 2012. Disponível em: https://www.scielo.br/j/jmoea/a/CJc6yVqmmgBZsbLjjdvDxnC/?lang=en. Acesso em: 04 jan. 2022. https://doi.org/10.1590/S2179-10742012000100007.pt_BR
dc.identifier.doi10.1590/S2179-10742012000100007
dc.identifier.issn2179-1074
dc.identifier.urihttps://repositorio.ufrn.br/handle/123456789/45557
dc.languageenpt_BR
dc.publisherSBMO/SBMagpt_BR
dc.rightsAttribution-NonCommercial 3.0 Brazil*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/3.0/br/*
dc.subjectMethod of Momentspt_BR
dc.subjectImmitance Approachpt_BR
dc.subjectFSSpt_BR
dc.subjectSpectral Domain Analysispt_BR
dc.subjectDouble Screen FSSpt_BR
dc.titleSpectral domain analysis of double screen frequency selective surfacespt_BR
dc.typearticlept_BR

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