Please use this identifier to cite or link to this item: https://repositorio.ufrn.br/jspui/handle/123456789/28673
Title: Modelling the raman spectrum of the amorphous- crystal Si system
Authors: Carriço, Arthur da Silva
Barrio, R. A.
Elliot, R. J.
Keywords: Modelagem do espectro Raman do sistema Si-cristal amorfo
Issue Date: 1986
Publisher: Institute of Physics (the “Institute”) and IOPscience
Citation: ELLIOT, R J; BARRIO, R. A.; CARRIÇO, Artur S. Modelling the Raman spectrum of the amorphous-crystal Si system. Journal of Physics C: Solid State Physics, v. 19, n. 8, p. 1113-1122, 1986. Disponível em: http://iopscience.iop.org/article/10.1088/0022-3719/19/8/010/meta Acesso em 26.fev. 2018.
Portuguese Abstract: A model to calculate the Raman response of small Si crystallites immersed in an amorphous Si matrix is developed. The structure of the system is modelled by an infinite crystalline slab of varying width, in which the atoms on the (111) surfaces on both sides of the slab are attached to Bethe lattices. The Raman response is obtained from a simple polarisability model using the Green function technique. The results are compared with recent experiments. The model can be used for Si crystallites with free and hydrogenated (111) surfaces.
URI: https://repositorio.ufrn.br/jspui/handle/123456789/28673
Appears in Collections:CCET - DFTE - Artigos publicados em periódicos

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